Advanced Materials Characterization Techniques
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Scope of this subject
This cluster of papers focuses on the advancements in atom probe tomography, a technique for three-dimensional nanoscale characterization of materials. The research covers topics such as specimen preparation, field evaporation behavior, spatial resolution, crystallographic mapping, and the application of correlative microscopy in materials science.
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Research vocabulary
atom probe tomography; field ion microscopy; field evaporation; TEM sample preparation; atom probe field ion microscopy; atom probe; crystal orientation mapping; transmission electron microscopy specimen preparation; field desorption; field ion microscope; three-dimensional atom probe; focused ion beam sample preparation; laser-assisted atom probe tomography; evaporation field; transmission Kikuchi diffraction; specimen thinning; field ion emission; local electrode atom probe; three-dimensional elemental mapping; thin foil preparation; focused ion beam tomography; plasma focused ion beam; specimen polishing; ion beam thinning; 3D-EBSD
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Numeric address and provenance
Morton address: 38359765034616369 · morton4x16-v1
Coordinates: (3, 22, 2204, 13552). The address interleaves categorical identifier bits. Nearby addresses are not guaranteed to describe semantically similar subjects.
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