Radiation Effects in Electronics
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Scope of this subject
This cluster of papers focuses on the challenges and techniques for fault tolerance in electronic systems, particularly in the context of soft errors, radiation effects, and single event upsets in CMOS technology. It explores various methods for error detection, reliability evaluation, and mitigation of transient faults in nanoelectronics.
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Research vocabulary
radioresistance; single event upset; single event effects; soft errors; space electronics; total ionizing dose; radiation hardening; fault injection; single event transients; SRAM; space radiation effects; radiation effects in semiconductors; triple modular redundancy; radiation testing; transient faults; radiation effects on electronics; memory reliability; soft error rate; SRAM-based FPGAs; single event latchup; space radiation environment; displacement damage; radiation effects in integrated circuits; single event burnout; heavy ion testing
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Local answer status
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Numeric address and provenance
Morton address: 36240456376027705 · morton4x16-v1
Coordinates: (3, 22, 2208, 11005). The address interleaves categorical identifier bits. Nearby addresses are not guaranteed to describe semantically similar subjects.
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