# VLSI and Analog Circuit Testing

{
  "id": "T11032",
  "title": "VLSI and Analog Circuit Testing",
  "url": "/topics/T11032",
  "kind": "topic-directory",
  "aeo_cohort": "topic-directory",
  "provider": "openalex",
  "revision": "423467d50a782972",
  "catalogue_revision": "f050b5d4780b1289",
  "numeric_address": "36174792625931283",
  "address_version": "morton4x16-v1",
  "coordinates": [
    3,
    17,
    1708,
    11032
  ],
  "answer_status": "Directory metadata; local answer requires separate source review",
  "truth_status": "Subject descriptor, not a factual answer or a demonstrated knowledge gap"
}

This cluster of papers focuses on various aspects of testing Very Large Scale Integration (VLSI) circuits, including techniques such as test data compression, embedded cores testing, scan testing, analog circuit fault diagnosis, BIST schemes, test access architectures, low-power testing, and delay fault testing.

Directory metadata is not a factual answer or evidence of a global knowledge gap.

Source: https://openalex.org/T11032

No owner-reviewed local answer yet.