{"cited_by_count":744000,"description":"This cluster of papers explores advancements in power electronics technology, focusing on wide bandgap semiconductors such as silicon carbide (SiC) and gallium nitride (GaN), reliability of power devices, high-temperature electronics, IGBT modules, thermal management, and failure modes. The papers cover topics such as the performance evaluation of SiC and GaN power devices, material science and device physics in SiC technology, condition monitoring for device reliability, and the potential of SiC nanowires in power electronics.","display_name":"Silicon Carbide Semiconductor Technologies","domain_id":"3","external_ids":{"openalex":"https://openalex.org/T10361","wikipedia":"https://en.wikipedia.org/wiki/Power_electronics"},"field_id":"22","id":"T10361","keywords":[{"display_name":"silicon carbide","id":"silicon-carbide","score":0.2992,"url":"https://openalex.org/keywords/silicon-carbide"},{"display_name":"4H-SiC","id":"4h-sic","score":0.7606,"url":"https://openalex.org/keywords/4h-sic"},{"display_name":"power semiconductor devices","id":"power-semiconductor-devices","score":0.5995,"url":"https://openalex.org/keywords/power-semiconductor-devices"},{"display_name":"SiC MOSFET","id":"sic-mosfet","score":0.6899,"url":"https://openalex.org/keywords/sic-mosfet"},{"display_name":"IGBT","id":"igbt","score":0.4397,"url":"https://openalex.org/keywords/igbt"},{"display_name":"3C-SiC","id":"3c-sic","score":0.476,"url":"https://openalex.org/keywords/3c-sic"},{"display_name":"6H-SiC","id":"6h-sic","score":0.6497,"url":"https://openalex.org/keywords/6h-sic"},{"display_name":"switching losses","id":"switching-losses","score":0.2086,"url":"https://openalex.org/keywords/switching-losses"},{"display_name":"power MOSFET","id":"power-mosfet","score":0.4063,"url":"https://openalex.org/keywords/power-mosfet"},{"display_name":"silicon carbide power devices","id":"silicon-carbide-power-devices","score":0.7304,"url":"https://openalex.org/keywords/silicon-carbide-power-devices"},{"display_name":"on-resistance","id":"on-resistance","score":0.3566,"url":"https://openalex.org/keywords/on-resistance"},{"display_name":"IGBT modules","id":"igbt-modules","score":0.6059,"url":"https://openalex.org/keywords/igbt-modules"},{"display_name":"high-voltage power devices","id":"high-voltage-power-devices","score":0.6061,"url":"https://openalex.org/keywords/high-voltage-power-devices"},{"display_name":"power modules","id":"power-modules","score":0.3659,"url":"https://openalex.org/keywords/power-modules"},{"display_name":"junction temperature","id":"junction-temperature","score":0.2864,"url":"https://openalex.org/keywords/junction-temperature"},{"display_name":"SiO2/SiC interface","id":"sio2-sic-interface","score":0.8101,"url":"https://openalex.org/keywords/sio2-sic-interface"},{"display_name":"silicon carbide thin films","id":"silicon-carbide-thin-films","score":0.5641,"url":"https://openalex.org/keywords/silicon-carbide-thin-films"},{"display_name":"gate driver","id":"gate-driver","score":0.3874,"url":"https://openalex.org/keywords/gate-driver"},{"display_name":"thyristors","id":"thyristors","score":0.2257,"url":"https://openalex.org/keywords/thyristors"},{"display_name":"parasitic inductance","id":"parasitic-inductance","score":0.2891,"url":"https://openalex.org/keywords/parasitic-inductance"},{"display_name":"specific on-resistance","id":"specific-on-resistance","score":0.4533,"url":"https://openalex.org/keywords/specific-on-resistance"},{"display_name":"4H-SiC MOSFET","id":"4h-sic-mosfet","score":0.9481,"url":"https://openalex.org/keywords/4h-sic-mosfet"},{"display_name":"double pulse test","id":"double-pulse-test","score":0.6962,"url":"https://openalex.org/keywords/double-pulse-test"},{"display_name":"power transistors","id":"power-transistors","score":0.2878,"url":"https://openalex.org/keywords/power-transistors"},{"display_name":"high-temperature electronics","id":"high-temperature-electronics","score":0.2524,"url":"https://openalex.org/keywords/high-temperature-electronics"}],"legacy_keywords":["Wide Bandgap Semiconductors","Reliability","Silicon Carbide","Power Devices","High-Temperature Electronics","IGBT Modules","GaN Power Devices","Thermal Management","Failure Modes","SiC Nanowires"],"openalex_id":"https://openalex.org/T10361","source_created_date":"2024-01-23T15:27:06","source_updated_date":"2026-10-17T03:02:00","subfield_id":"2208","url":"/topics/T10361","works_api_url":"https://api.openalex.org/works?filter=topics.id:T10361","works_count":81518,"label":"Silicon Carbide Semiconductor Technologies","provider":"openalex","revision":"ed3c9b6429eb3f53","taxonomy_revision":"f050b5d4780b1289","title":"Silicon Carbide Semiconductor Technologies","kind":"topic-directory","aeo_cohort":"topic-directory","catalogue_revision":"f050b5d4780b1289","numeric_address":"36239904472728121","address_version":"morton4x16-v1","coordinates":[3,22,2208,10361],"answer_status":"Directory metadata; local answer requires separate source review","truth_status":"Subject descriptor, not a factual answer or a demonstrated knowledge gap","reviewed_answer":null}