{"id":"S92005959","label":"Boundary scan testing","description":"","source_url":"https://id.loc.gov/authorities/subjects/sh92005959","normalized_label":"boundary scan testing","broader":["http://id.loc.gov/authorities/subjects/sh92005960"],"aliases":["BST (Printed circuit board testing method)","Boundary scan methods"],"source_identifier":"http://id.loc.gov/authorities/subjects/sh92005959","provider":"lcsh","revision":"f62798e6e489a379","taxonomy_revision":"f050b5d4780b1289","title":"Boundary scan testing","url":"/topics/S92005959","kind":"topic-directory","aeo_cohort":"topic-directory","catalogue_revision":"f050b5d4780b1289","numeric_address":"4920407186406261254","address_version":"morton4x16-v1","coordinates":[0,21,61337,7168],"answer_status":"Directory metadata; local answer requires separate source review","truth_status":"Subject descriptor, not a factual answer or a demonstrated knowledge gap","reviewed_answer":null}