{"id":"S85119424","label":"Secondary ion mass spectrometry","description":"","source_url":"https://id.loc.gov/authorities/subjects/sh85119424","normalized_label":"secondary ion mass spectrometry","broader":["http://id.loc.gov/authorities/subjects/sh85081907"],"aliases":["SIMS (Spectrum analysis)"],"source_identifier":"http://id.loc.gov/authorities/subjects/sh85119424","provider":"lcsh","revision":"e1fb6ebb0e0ef770","taxonomy_revision":"f050b5d4780b1289","title":"Secondary ion mass spectrometry","url":"/topics/S85119424","kind":"topic-directory","aeo_cohort":"topic-directory","catalogue_revision":"f050b5d4780b1289","numeric_address":"288301037020907076","address_version":"morton4x16-v1","coordinates":[0,20,19271,0],"answer_status":"Directory metadata; local answer requires separate source review","truth_status":"Subject descriptor, not a factual answer or a demonstrated knowledge gap","reviewed_answer":null}